Figure 7: Demonstration of time-reversal-invariant ‘spin’ flipping defect.
From: Probing topological protection using a designer surface plasmon structure
Simulated (a) and observed (c) field pattern when a metallic block (shown in e) is located near a lattice ring without touching. Simulated (b) and observed (d) field pattern when the metallic block (shown in f) is inserted in a lattice ring. Metal is modelled as a perfect electric conductor in simulation. The dashed rectangles show the positions of defects. The dashed lines denote positions of transmission measurement.
