Fig. 2: Morphology characterization of the nanoprobe.

a SEM image showing (i) the glass nanopipette, (ii) the nanopipette coated with Pt and Ni on both sides, and (iii) the nanoprobe coated with Al2O3. b EDS maps of the nanoprobe revealing the presence of Si, O, Ni, Pt, and Al at the nanoprobe tip. c Illustration of the FIB milling and subsequent HIM imaging. The nanoprobe sample was positioned perpendicular to the FIB detector, while the HIM detector was at a 54° angle relative to the FIB detector. d HIM images of the nanoprobe before FIB cutting and (e) after FIB cutting