Fig. 5: Testing of EDS, Raman spectrum, and XRD spectrum of processed DLC-UME. | Microsystems & Nanoengineering

Fig. 5: Testing of EDS, Raman spectrum, and XRD spectrum of processed DLC-UME.

From: Controllable tip exposure of ultramicroelectrodes coated by diamond-like carbon via direct microplasma jet for enhanced stability and fidelity in single-cell recording

Fig. 5

a Images of element distribution on the surface of the processed UME tip. b Raman spectrum of UME tips before and after microplasma jet processing. c EDS and element weight percentage of the processed UME tip. d XRD of the DLC coating on the surface of the processed UME

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