Fig. 1: Temperature effect on the CE between the DI water and the SiO2. | Nature Communications

Fig. 1: Temperature effect on the CE between the DI water and the SiO2.

From: Quantifying electron-transfer in liquid-solid contact electrification and the formation of electric double-layer

Fig. 1

(a) The setup of the charging experiments, where the negative charges generated on the SiO2 surface could be electrons and O− ions induced by surface ionization reaction. (‘O’ is the Oxygen atom, ‘Si’ is the silicon atom and ‘O−’ is the Oxygen ion). (b) The setup of AFM platform for the thermionic emission experiments. (c) The decay of the CE charge (induced by contacting with the DI water at room temperature) on the SiO2 surface at different substrate temperatures. (d) The CE charge density on the SiO2 sample surface in the charging (contacting with the DI water at room temperature) and heating (at 513 K for 10 min) cycle tests. (Error bar are defined as s. d.).

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