Fig. 4: The topography and surface potential characteristics of DNTT polycrystalline films measured by Kelvin probe force microscopy (KPFM). | Nature Communications

Fig. 4: The topography and surface potential characteristics of DNTT polycrystalline films measured by Kelvin probe force microscopy (KPFM).

From: Effectively modulating thermal activated charge transport in organic semiconductors by precise potential barrier engineering

Fig. 4

a–c Topography images of DNTT polycrystalline films with grain sizes of 200 nm, 350 nm and 520 nm, respectively. d–f Surface potential images of DNTT polycrystalline films. g–i Line section profile of topography and surface potential.

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