Fig. 3: Structural characterization of Nd4Ni3O10/NdGaO3 (110) (ϵ = + 0.8%).
From: Limits to the strain engineering of layered square-planar nickelate thin films
a XRD scan of a Nd4Ni3O10/NdGaO3 film. The asterisks denote substrate peaks and the vertical lines mark the 00l peak positions of bulk Nd4Ni3O1095. b Schematic crystal structures depicting three regions in (d). c MAADF-STEM image of the Nd4Ni3O10/NdGaO3 film shown in (a). d Atomic-resolution HAADF-STEM image showing the representative lattice structure of the film with atomic model overlays. The yellow box highlights horizontal rock salt ordering while the green and red boxes show regions with half and three unit cell long vertical rock salt faults, respectively.
