Fig. 3: Evaluation of the integrated microscope with mass-producible fabrication.
From: Large depth-of-field ultra-compact microscope by progressive optimization and deep learning
a The sketch of the PSF calibration setup of the integrated microscope with a customized 1-µm pinhole array through lithography. b Maximum intensity projections (MIPs) of captured PSF in xy, xz, and yz planes. The bottom plot shows the magnification changes across different depths. c Comparisons of simulated and experimental 3D PSFs at three different lateral positions. d Comparisons of the PSF size between simulations (red) and experiments (blue) at different lateral positions across a 300-µm axial range. e Characteristics of DOF extension through imaging the USAF-1951 resolution target. Top: imaging results with a conventional microscope (without DOE coding). Bottom: imaging results with a proposed integrated microscope with network restoration. f The contrasts of element 6, group 6 of the resolution target at different depths for the proposed integrated microscope (red) and conventional microscope (blue). g Full-width-half-maximums (FWHMs) of the 1-µm pinhole at different depths after network restoration (3.1 µm at z = 0 µm, 3.5 µm at z = 100 µm, and 4.8 µm at z = 150 µm). h The curves of structure similarity index (SSIM) calculated by PSFs of different illumination colors versus different lateral positions. Shaded areas: mean ± SD.
