Fig. 2: Crystal and microstructure characterizations of CGBi1.5.
From: Improved figure of merit (z) at low temperatures for superior thermoelectric cooling in Mg3(Bi,Sb)2
a Rietveld refinement against the X-ray diffraction patterns at 300 K for CGBi1.5. b The probability distribution of elemental compositions at different regions of a 12.7 mm diameter CGBi1.5 pellet. c The high-resolution scanning transmission electron microscopy (STEM) image of CGBi1.5, with the fast Fourier transform (FFT) diffractogram shown in the inset. d The STEM image of CGBi1.5 and line profile along the dashed blue line marked in the image.
