Fig. 5: Structural origin of stress memory effect for the TiZrHfCuNiBe high-entropy MG at 593 K.
a The reduced pair distribution function G(r) in the stress decreasing stage during pre-loading at a fixed strain of 0.5% and b the corresponding evolution of the full width at half maximum (FWHM) of the first peak. c The evolution of G(r) during the memory stage with \({\varepsilon }_{2}\) = 0.3% (after \({\varepsilon }_{1}\) = 0.5% and tw = 900 s) and d the corresponding evolution of FWHM of the first peak. The insets show the zoomed-in data of the corresponding nearest neighbor atomic diffraction peaks. e The correlation between the memory peak time tp and the recovery characteristic time \({\tau }_{{rec}}\). The square, triangle, and circular symbols represent data measured at different preloading variables of temperature, strain, and time, respectively. The data of peak time tp are taken from Fig. 2 and Supplementary Fig. 2. The blue solid straight line represents the linear fitting of tp = -630.4 + τrec, with a high regression coefficient of R2 = 0.99. f The schematic illustration for the evolution of atomic packing structure for anelastic stress relaxation and recovery (memory) process. Source data are provided as a Source Data file.
