Fig. 5: Analysis of the deviation of cracks.
From: Programming crack patterns with light in colloidal plasmonic films
a, b, c Optical microscopy images of deviated cracks due to a circular laser spot of 100 µm, 400 µm and 600 µm respectively. d Analysis of the cracks deviation – delta A – depending on the size of the hole of the mask. e Analysis of the cracks deviation – delta A – depending on the laser’s power. f Analysis of the cracks deviation – delta A – depending on the concentration in AuBP. Specifically, the concentration of plasmonic particles was multiplied by four (AuBP 4) and reduced by four (AuBP 0.25), while keeping the other conditions constant (laser power of 3.4 W/cm2 and spot size of 400 µm). Lines correspond to the Gaussian fit. g, h, i Optical microscopy images of deviated cracks due to dimer spots spaced of 0 µm, 100 µm and 300 µm respectively. Source data of Figure (d, e, f) are provided as a Source Data file.
