Fig. 2: Clean transfer method with CD support layer. | Nature Communications

Fig. 2: Clean transfer method with CD support layer.

From: Cyclododecane-based high-intactness and clean transfer method for fabricating suspended two-dimensional materials

Fig. 2

a The optical image of single-layer graphene transferred onto Si wafer with the assistance of CD. b–c Atomic force microscopy (AFM) characterization and the height distribution of graphene transferred onto Si wafer by CD. Ra: average roughness. d AFM characterization of the fabricated single-layer suspended graphene on SiN holey substrate using CD as support layer, the diameter for the suspended region is 10 µm. e–f TEM characterization and selected area electron diffraction (SAED) of the transferred single-layer suspended graphene on SiN holey substrate.

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