Fig. 1: Analysis of the impact of 4D-STEM conditions on low-dose ptychography through simulations. | Nature Communications

Fig. 1: Analysis of the impact of 4D-STEM conditions on low-dose ptychography through simulations.

From: Atomically resolved imaging of radiation-sensitive metal-organic frameworks via electron ptychography

Fig. 1

a Schematic representation of 4D-STEM utilized for multislice electron ptychography on a thick specimen. b Structural model of MOF Zr-BTB employed in 4D-STEM simulations, projected along the [100] axis. Green Zr, red O, gray C, pink H. c A single convergent-beam electron diffraction (CBED) pattern from a 4D-STEM dataset simulated with a total electron dose of 100 e−/Å2. d, e Iterative reconstruction error curves (d) and reconstructed ptychography phase images (e) using 4D-STEM datasets simulated at varying convergence semi-angles with a consistent electron dose of 100 e−/Å2. The 10-mrad case shows the best reconstruction, as marked by the red square.

Back to article page