Fig. 1: Phase and morphology characterization.
From: Orbital-level band gap engineering of RuO2 for enhanced acidic water oxidation
a XRD patterns of RuO2 and R-RuOx (R = N, P, S, Se). b Extended XRD patterns derived from (a). c TEM images of Se-RuOx. d Elemental mappings of Se-RuOx at a 1 nm scale by HAADF-STEM. e–g AC-HAADF-STEM images and the corresponding lattice fringe profile of Se-RuOx. h FFT pattern in (g). i HAADF-STEM image and the simulated molecular structure of Se-RuOx.
