Extended Data Fig. 5: Dependence of ferroelastic writing on scan resolution.
From: Ferroelastic writing of crystal directions in oxide thin films
a, ECC image of ferroelastic domains written with different scanning resolutions of 128, 256, and 512 lines in a 10 nm-thick SrRuO3 (001) thin film. The white boxes mark the ferroelastically written regions. Red and yellow dotted arrows indicate the fast and slow scan directions. The tip loading was fixed at 3.4 μN. b, ECC image of SrRuO3 (001) showing a stripe ___domain with a width of approximately 100 nm, written by a tip with a radius of approximately 100 nm and a relatively high loading force of 7.5 μN. c, ECC image of SrRuO3 (111) showing stripe domains with a width of approximately 20 nm. The outer box of 3 × 3 μm2 area was written in the X1 direction with 256 lines, and the line domains were written with 30 lines in the X2 direction for a 2 × 2 μm2 area. A loading force of 3.0 μN was used for both areas. Fast scan directions are marked by red arrows.
