Fig. 3: Observed and expected MD distributions.
From: Observation of electroweak production of two jets and a Z-boson pair

a–c, Distributions after the statistical fit in the ℓℓℓℓjj QCD CR (a), and in the ℓℓℓℓjj (b) and ℓℓννjj SRs (c). The error bands represent the s.d. and include the experimental and theoretical systematic uncertainties, as well as the uncertainties in μEW and \({\mu }_{{{{\rm{QCD}}}}}^{\ell \ell \ell \ell jj}\). ZZ (EW), ZZ (QCD) and ggZZ represent contributions from EW, non-gg QCD and gg QCD ZZjj processes, respectively. WZ represents contribution from WZjj process. All the minor backgrounds are summed together as ‘Others’, and the WWjj and \(t\overline{t}\) processes are referred to as ‘NonRes’. The statistical uncertainties of the data are shown as error bars. The open arrows represent the out-of-range markers. The horizontal bin width is indicated on the vertical axis legend.