Extended Data Fig. 2: Electron diffraction analysis of a mechanically exfoliated α-Bi4Br4. | Nature Physics

Extended Data Fig. 2: Electron diffraction analysis of a mechanically exfoliated α-Bi4Br4.

From: Quantum transport response of topological hinge modes

Extended Data Fig. 2

flake.a, Scanning electron microscopy image of rectangular-shaped α-Bi4Br4 thin flakes on a Si substrate. The crystallographic plane and the axes are indicated for the largest flake used for the diffraction analysis. b, Transmission electron microscopy image displaying the cross-section of the thin flake, which is perpendicular to the long axis of the flake. Inset: corresponding electron diffraction pattern from the [010] zone axis.

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