Extended Data Fig. 10: Long-time continuous illumination stability tests.
From: A fabrication process for flexible single-crystal perovskite devices
a–d, Summarized tracking results of JSC (a), VOC (b), FF (c) and PCE (d). The differences between single-crystal and polycrystalline devices are not as large as for the shelf-stability tests in Fig. 4f, which may be because of the poor thermal stability of the hole transport layer (spiro) used in all of these devices. In any case, relatively speaking, single-crystal devices show a better stability than polycrystalline devices.
