Figure 1

(a) The θ–2θ XRD spectra of epitaxial Li_1+xTi_2-xO_4-δ (0 ≤ × ≤ 1/3) thin films grown on (001) MAO substrates at different P_O2. (b) The φ-scan measurements of LiTi₂O_4-δ and Li₄Ti₅O₁₂ thin films on MAO (001) in the (404) reflection. (c) The lattice constant along c axis of the samples versus P_O2.