Figure 4
Surface topography and current distributions of semiconducting inside part (a) and surface nitrided layer (b) of the crystal heated with NH3 and CeO2 powder (C-AFM images). The upper and lower figures indicate mapping profiles of height and current, respectively. Micro-sized voids were formed on both of the surface, however, the current was detected only at deep voids on the surface of the transparent inside part.
