Figure 1
From: On the Large Near-Field Enhancement on Nanocolumnar Gold Substrates
SEM images (the white scale bar is 300 nm, top view above and cross section along the particle flux direction below) of (a) Au10 and (b) Au20 samples with their corresponding (c and d) statistical analysis and (e and f) their measured and calculated reflectance. In (c,d), the blue bars represent the direct results from the analysis of the images with the corresponding mean value and standard deviation and the yellow lines show the probability distribution function (pdf) calculated with those values for a normal and log-normal distribution respectively. In (e,f), the blue and green lines denote the theoretical reflectance calculated by the FDTD method for longitudinal (Ex) and transversal (Ey) polarised light, the red lines represent the reflectance for unpolarised light calculated by averaging the previous values, and the purple lines correspond to the measured reflectance.
