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Figure 1

From: Integration of amorphous ferromagnetic oxides with multiferroic materials for room temperature magnetoelectric spintronics

Figure 1

Amorphous microstructure and cation composition of FDTO. Panel (a) HRTEM image showing protective top Au layer, middle FDTO layer, and bottom quartz layer (top panel). Bottom panels shows the diffraction pattern taken from the FDTO layer (red box) and Au layer (blue box). Panel (b) The elemental distribution of Fe, Dy, Tb and O (top to bottom) obtained from EELS spectrum of the area inside the purple box. (c) XPS signal and peak fitting for the various metals and oxygen. (d) Quantification of the observed valence states of Fe (Fe2+ and Fe3+; left y-axis), and the ratio of Fe3+/Fe2+ (right y-axis) across varying oxygen pressure from 1 × 10−6 to 5 × 10−6 Torr. (e) Atomic % of the three metals measured by energy dispersive spectroscopy for films deposited at the various pressures, showing elemental composition of a-FDTO to be very close to that of the metallic target and consistent over all pressures. For Figure (a–c), a film deposited at 2 × 10−6 Torr of pressure was used.

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