Figure 2

Structural characterization of BM-SFO thin films grown on SRO/STO(001) and STO(001) substrates using XRD. XRD θ−2θ scans of (a) BM-SFO/SRO/STO(001) and (c) BM-SFO/STO(001). XRD rocking curves of the BM-SFO(010)pc peaks for (b) BM-SFO/SRO/STO(001) and (d) BM-SFO/STO(001). The FWHM of the rocking curve is indicated in each figure.