Figure 1
From: Distributions of easy axes and reversal processes in patterned MRAM arrays

(a) The relative alignment of each pillar changes as H\(_{\mathrm a}\) is swept across the normal direction, broadening the distribution of switching fields and lowering the reduction in H\(_{\mathrm c}\) from the 30% predicted by the Stoner-Wohlfarth model. (b) Example data for a typical waiting time measurement of a continuous thin film, where the value of t is taken at a constant M under different values of H\(_{\mathrm a}\), reproduced from16,17.