Figure 17
From: Monitoring the process mean under the Bayesian approach with application to hard bake process
Bayesian AEWMA CC applying linearly increasing variance under SELF for D = 3.
Figure 17 | Scientific Reports
From: Monitoring the process mean under the Bayesian approach with application to hard bake process
Bayesian AEWMA CC applying linearly increasing variance under SELF for D = 3.
