Table 8 The run length profiles for Bayesian AEWMA CC in the presence of ME using P distribution under LLF for multiple measurement method, with \(\lambda\) = 0.10.
From: Monitoring the process mean under the Bayesian approach with application to hard bake process
Shift | No Error | 0.1 | 0.2 | 0.5 | 1 | |||||
|---|---|---|---|---|---|---|---|---|---|---|
ARL | SDRL | ARL | SDRL | ARL | SDRL | ARL | SDRL | ARL | SDRL | |
0.0 | 370.83 | 432.54 | 369.61 | 430.50 | 371.36 | 433.89 | 372.87 | 425.86 | 370.41 | 432.59 |
0.10 | 164.63 | 163.35 | 165.60 | 163.86 | 167.76 | 165.78 | 170.86 | 172.62 | 181.11 | 180.26 |
0.20 | 76.89 | 69.61 | 76.82 | 70.60 | 77.84 | 72.19 | 81.17 | 74.10 | 86.94 | 79.57 |
0.30 | 43.21 | 39.75 | 44.47 | 40.19 | 45.10 | 41.45 | 47.12 | 42.50 | 49.59 | 45.07 |
0.40 | 27.91 | 25.54 | 28.51 | 26.25 | 29.50 | 26.84 | 30.48 | 27.93 | 32.15 | 29.46 |
0.50 | 19.23 | 17.75 | 19.55 | 18.07 | 20.10 | 18.45 | 20.83 | 19.47 | 22.40 | 20.57 |
0.60 | 13.86 | 12.81 | 14.08 | 13.01 | 14.37 | 13.36 | 14.94 | 13.86 | 16.30 | 14.94 |
0.70 | 10.39 | 9.42 | 10.49 | 9.61 | 10.91 | 9.99 | 11.29 | 10.49 | 12.41 | 11.33 |
0.80 | 8.03 | 7.24 | 8.22 | 7.40 | 8.43 | 7.60 | 8.86 | 7.97 | 9.62 | 8.71 |
0.90 | 6.46 | 5.66 | 6.67 | 5.84 | 6.85 | 6.00 | 7.14 | 6.28 | 7.65 | 6.87 |
1.0 | 5.41 | 4.58 | 5.48 | 4.68 | 5.61 | 4.77 | 5.80 | 5.05 | 6.34 | 5.50 |
1.5 | 2.67 | 1.91 | 2.73 | 1.97 | 2.79 | 2.02 | 2.90 | 2.13 | 3.11 | 2.36 |
2.0 | 1.77 | 1.02 | 1.79 | 1.06 | 1.83 | 1.09 | 1.88 | 1.15 | 2.00 | 1.25 |
2.5 | 1.35 | 0.62 | 1.38 | 0.64 | 1.40 | 0.66 | 1.43 | 0.70 | 1.50 | 0.76 |
3 | 1.16 | 0.40 | 1.16 | 0.41 | 1.18 | 0.43 | 1.20 | 0.45 | 1.24 | 0.51 |
