Fig. 17: Time-dependant SCLC measurement.
From: Advanced spectroscopic techniques for characterizing defects in perovskite solar cells

a Temperature-dependent I-V curves for a MAPbI3 single crystal. b Conceptual schematic of the SCLC method in the case of electron injection. c I-V curves vs temperature for a MAPbI3 single crystal contacted using MoO3/ Au/ Ag. d Conceptual schematic of the SCLC method in the case of hole injection. e The density of trap states within the bandgap was extracted from the temperature-dependent SCLC method. Reproduced with permission from ref. 92, copyright (Wiley-VCH Verlag GmbH and Co. KGaA, Weinheim, 2016).