Fig. 6: Conductance noise robustness analysis on point cloud classification, part segmentation, and semantic segmentation tasks.
From: Random memristor-based dynamic graph CNN for efficient point cloud learning at the edge
a Physical origin of conductance fluctuation in memristor. b Experimental read noise of memristor over 10,000 cycles. c, Illustration of simulated conductance fluctuation of different levels. d Classification accuracy on ModelNet40 under various conductance fluctuation levels. e Part segmentation performance on ShapeNet under various conductance fluctuation levels. f Semantic segmentation performance on S3DIS under various conductance fluctuation levels.
