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Figure 1

From: Insulating phase at low temperature in ultrathin La0.8Sr0.2MnO3 films

Figure 1

Samples preparation and characterization.

(a) RHEED oscillations recorded during the growth of the 10 u.c. LSMO film and (b) AFM image of the 10 u.c. film. (c) HAADF micrograph of the 10 u.c. LSMO thin film taken by an aberration-corrected STEM. (d) Zoomed and filtered image of the rectangular part in (c) with the red arrow of numbered peaks. The yellow arrows indicate where the STO/LSMO interface locates. (e) Intensity line profile of the region marked by the red arrow in (d). The different contrast of La and Sr provides localization of the interface indicated by the yellow dashed line in (e).

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