Fig. 2: Morphologic characterization of the as-obtained EMM-8.

a, b Scanning electron microscopy images of the EMM-8 with different magnification. The red dotted areas in a were magnified and observed, as shown in b. c–e Transmission electron microscopy images of the EMM-8 with different magnification and its selected area electron diffraction (SAED) patterns. f–h Atomic force microscope images of the EMM-8. Source data are provided as a Source Data file.