Fig. 3: Dielectric energy storage of BHO thin-film capacitors.
From: Structure-evolution-designed amorphous oxides for dielectric energy storage
a P-E hysteresis loops of Pt/BHO/LSMO capacitors measured at 10 kHz. b Two-parameter Weibull distribution analysis of breakdown strengths over 12 capacitors for each Ba concentration. c Statistical Eb and (d) Weibull modulus β extracted from (b) plotted as a function of Ba concentration. Here, β is the slope of ln[−ln(1−p)] vs. lnEb, where p = i/(n + 1) (n is the total number of samples and i is the ith sample). e Energy storage density (Urec) and efficiency (η) of the BHO capacitors calculated from P-E loops. The error bars are averaged over 12 capacitors for each Ba concentration.
