Fig. 2: Li deposition behaviour in the TiN NT at different SOCs.

a Normalized TOF-SIMS depth profile of Li⁺ secondary ions for TiN NTs at various SOCs. b A 3D rendering of the Li⁺ secondary ion depth profiles in (a) at 100% SOC. c TOF-SIMS 2D chemical mapping of Li⁺ secondary ion signals at various sputtering times.