Fig. 3: Gate-bias independent RTN dynamics and defect correlation.
From: A stochastic encoder using point defects in two-dimensional materials
a RTN traces obtained for \({V}_{{{{\rm{BG}}}}}\) = -3.2, -3.4, -3.6, -3.8 and -4 V at \({{{\rm{T}}}}\) = 15 K. Normalized histogram plots for b \({\tau }_{{{{\rm{c}}}}}\) and c \({\tau }_{{{{\rm{e}}}}}\). Insets show the exponential fits for extracting \(\bar{{\tau }_{{{{\rm{e}}}}}}\) and \(\bar{{\tau }_{{{{\rm{c}}}}}}\). d \(\bar{{\tau }_{{{{\rm{e}}}}}}\) and \(\bar{{\tau }_{{{{\rm{c}}}}}}\) as a function of \({V}_{{{{\rm{BG}}}}}\) obtained through exponential fits to the experimental data. e \(\bar{{\tau }_{{{{\rm{e}}}}}}\) and \(\bar{{\tau }_{{{{\rm{c}}}}}}\) as a function of \({V}_{{{{\rm{BG}}}}}\) obtained using a Canny step detection algorithm. The dots represent the median values, while the whiskers show the maximum and minimum values, providing a range for each measurement. The purple lines indicate the sampling interval (\({\tau }_{{{{\rm{s}}}}}\) = 2 ms) and ten times the sampling interval, respectively. For accurate extraction of time constants, they must exceed approximately ten times the sampling time.
