Fig. 5: Experimental demonstration of the robustness of topological surface, hinge, and corner states.
From: Realization of a three-dimensional photonic higher-order topological insulator
Cutaway views of the measured electric field distributions of the topological surface (a), hinge (b), and corner (c) states with defects, respectively. The insets display photographs of the defects introduced by removing dielectric rods (red circles). Simulated electric field distributions of the topological surface (d), hinge (e), and corner (f) states with defects, respectively. The insets show the defects introduced by removing dielectric rods (white dotted cylinders). The cyan star represents the point source.
