Extended Data Fig. 1: Scanning electron microscope (SEM) images of device S1, S2, S3 and S4. | Nature Physics

Extended Data Fig. 1: Scanning electron microscope (SEM) images of device S1, S2, S3 and S4.

From: Correlated order at the tipping point in the kagome metal CsV3Sb5

Extended Data Fig. 1

S1 and S4 are membrane devices with reduced differential thermal contraction strain, while S2 is glued down to a sapphire substrate, the coupling between the substrate and sample results in the non-negligible uni-axial strain at low temperature. S3 is a similar device with S2, yet after taking the SEM image, a glue droplet is applied on top of the device to reduce uniaxial strain at low temperature.

Back to article page