Extended Data Fig. 5: Real-time growth process of ice Ic from vapour deposition at 102 K.
a, b, Snapshots and corresponding FFT of in-situ imaging showing the long-term ice Ic growth process from vapour deposition. High density of defects on (1\(\bar{1}\)1) plane cause streaking in the diffraction spots of ice Ic crystallite. Liquid nitrogen was refilled to the Dewar of the cryo-holder every three hours to maintain a low temperature of 102 K. c, High-magnification image and corresponding FFT of defects in the ice Ic crystallite in (a) and another new ice Ic crystallite nearby showing the continuous nucleation and then crowded growth of ice Ic from prolonged vapour deposition. The crowded growth of multiple ice Ic crystallites result in multiple sets of diffraction spots to appear in the corresponding FFT of the TEM image. Each image was obtained by summing eight aligned frames in one corresponding low-dose image stack acquired at a frame rate of 40/s and a dose rate of 126 e−/Å2/s with an irradiation time of 0.4 s. Scale bars, 20 nm for (a), (b); 2 nm for (c).
