Fig. 2: The effect of ultrafast photoinjection on the test pulse transmitted through the 230-nm-thick silicon sample.
From: Dynamic optical response of solids following 1-fs-scale photoinjection
a, The reference waveform \({E}_{{\rm{ref}}}(t)\) (black), which is the electric field of the test pulse transmitted through the unperturbed sample, is compared with a test waveform with photoexcitation preceding the test pulse (blue) and the waveform measured with the 3 fs pump pulse arriving at t = 0 (orange). The shaded areas represent the standard deviations from three independent measurements. b, The measured photoexcitation-induced change in the transmitted electric field, ΔE, for several arrival times of the pump pulse, τ. The dashed curve shows the envelope of \({E}_{{\rm{ref}}}(t)\).
