Extended Data Fig. 2: Coaxial detector tip.
From: Characterization of just one atom using synchrotron X-rays

a, Transmission X-ray microscopy image of a detector tip shows several materials composing the tip. Scanning electron microscopy image of a detector tip before (b) and after (c) incision. Here the PtIr conducting core is used to collect electrons, whereas the SiO2 insulating layer prevents collection of ejected electrons from the sample by the side wall of the tip. The outer Au conducting layer is to protect from the charging effect34,35.