Extended Data Fig. 2: Characterization of Cug/PCN.
a, High-resolution TEM image with the corresponding Fourier transform diffraction pattern inset. b, ADF-STEM image and corresponding elemental maps. c, Atomic force microscopy image of Cug/PCN with height profile inset. d, XRD patterns of PCN and Cug/PCN. e, Cu 2p XPS spectra of Cug/PCN. The peaks at 932.8 eV and 952.7 eV are assigned to Cu(I). The solid red line and dotted black line represent the experiment and fitting curves, respectively. f, EPR spectra of Cug/PCN and the reference CuCl2.
