Extended Data Fig. 2: Direct comparison of the resolution performance of SRRF, eSRRF and SIM with an ARGO-SIM calibration slide.
a Fluorescence image of the gradually spaced line pattern on the ARGO-SIM calibration slide which displays line pairs with a distance increase of 30 nm per column. b Image sections of the area marked by red dashed outline across pattern #5 to #9 (120–240 nm line spacings) of a diffraction-limited (WF) image and the respective super-resolved reconstructions achieved by SRRF (TRA, M = 2, R = 0.6, A = 2, nfr = 5000), eSRRF (AVG, M = 2, R = 1, S = 2, nfr = 5000) and SIM processing, c Intensity profiles across pattern #5 and #6 (as indicated by red line in b) allow to resolve the line pair #5 with a distance of 120 nm only in the case of eSRRF and SIM reconstruction, while these lines are not distinguishable in the case of SRRF processing and for the WF data. Scale bar: 5 µm.
