Figure 3
SEM secondary electron images of (a) the ___location where the FIB foil was lifted out; (b) the FIB specimen with string-shaped morphologies arrowed; TEM bright-field image of (c) a string-shaped morphology and its corresponding etch-pit and (d) string-shaped morphology at a higher magnification; (e) TEM dark-field image of α laths by selecting the diffraction spots circled in (f); (f) SAD pattern with beam direction paralleled to [\(1\bar{3}\bar{1}\)]β corresponding to (e) (The yellow dashed lines indicate the reflections from double diffraction). The FIB sample was from the Ti6554 specimen deformed at 10000 s−1 and 873 K.
