Fig. 4: Photoelectric characteristics of films and devices.
From: Self-deposited passivation for decreasing scalable processing loss of perovskite solar cells
a PL spectra. The films were deposited on glass and the light incident from the top and bottom side. b TRPL spectra of control and target films. c SCLC measurement of control and target electron-only devices. d SCLC measurement of control and target hole-only devices. e EIS spectra of control and target devices. The inset shows the equivalent circuit diagram. f VOC versus light intensity for control and target devices.
