Frequency-shifted f-2f interferometer for unveiling the noise performance of carrier-envelope offset in passively stabilized frequency combs

Journal:
Applied Physics Letters
Published:
DOI:
10.1063/5.0238480
Affiliations:
5
Authors:
11
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Institutions Authors Share
National Institute of Metrology (NIM), China
9.000000
 0.82
Institute of Artificial Intelligence, Hefei Comprehensive National Science Center, China
1.000000
 0.09
Max-Born-Institute for Nonlinear Optics and Short Pulse Spectroscopy (MBI), Germany
0.500000
 0.05
Humboldt University of Berlin (HU Berlin), Germany
0.500000
 0.05