Halide perovskites are promising materials for light-emitting devices, given their narrowband emission and solution processability. However, detailed information on device degradation during operation is required to improve their stability, and this is challenging to obtain. Ji et al. propose a self-supervised deep learning method to capture multi-dimensional images of such devices in their operating regime faster than allowed by conventional imaging techniques.
- Kangyu Ji
- Weizhe Lin
- Samuel D. Stranks
