Fig. 5
From: Fabrication and X-ray microtomography of sandwich-structured PEEK implants for skull defect repair
FE-SEM images and EDS mapping of the PEEK implant. (a) the microstructure of the PEEK samples with three layers; (b) high magnification of FE-SEM image in a; (c) the microstructure in the porous layer; (d) the microstructure of an integrated pore in the porous layer; (e) mapping of C element, and (f) mapping of O element.
