Fig. 3: AFM and SNOM characterization of silicon-graphene step structures.
From: High-order near-field imaging of low-dimensional materials at infrared wavelengths
a The 3rd-order (low-order) near-field optical image of a Graphene-Si step. Inset: the corresponding AFM image. b The 5th-order (high-order) near-field optical image of the Graphene-Si step. c Difference of scattering intensity between graphene and Si. d Scattered signal intensity values at the white dotted line. The curves of the measured image and the simulated image are well-matched
