To design and fabricate advanced polymer-based multilayer devices and composite materials, it is crucial to gain a better understanding of the aggregation states at the surface and at interfaces with solid materials in polymer films. Here, we report the depth profile of polyrotaxane (PR) when mixed with polystyrene (PS), analyzed using X-ray photoelectron spectroscopy and neutron reflectivity. Our findings indicate that PS and PR segregated at the surface and the substrate interface, respectively, with the extent of segregation depending on the length of the PS chains.
- Miki Taguchi
- Noboru Miyata
- Keiji Tanaka
